GaN单晶的HVPE生长与掺杂进展
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齐占国, 刘磊, 王守志, 王国栋, 俞娇仙, 王忠新, 段秀兰, 徐现刚, 张雷
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Progress in GaN Single Crystals: HVPE Growth and Doping
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QI Zhanguo, LIU Lei, WANG Shouzhi, WANG Guogong, YU Jiaoxian, WANG Zhongxin, DUAN Xiulan, XU Xiangang, ZHANG Lei
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表1 不同类型掺杂GaN的对比[2-3,32]
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Table 1 Different types of doped GaN[2-3,32]
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Type | Impurities | Dopant | Characteristic | Application | Ref. | n type | Si | SiCl2H2 | High carrier concentration; anti-surfactant effect | High power and high current optoelectronic devices (LED, LD) | | Ge | GeCl4/Ge3N4 | Little effect on lattice structure and stress, causing no morphological deterioration, higher carriers concentration than that of Si-doped; creating cavities inside the sample | [3] | p type | Mg | Mg(S) | Increased lattice constant and band gap width, high conductivity | Luminescent device | [32] | Semi- insulating | Fe | Fe(S)/Cp2Fe | High resistivity (iron showing a parasitic effect, easy to diffuse) | High power/frequency devices, HEMT, photoconductive switch, detectors | [2] | Mn | Mn(S) | C | CH4/C2H4/C5H12 |
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