不同基底上SiO2薄膜的显微结构和力学性能
王河1,2, 贺洪波1, 张伟丽1

Substrate Effects on the Microstructure and Mechanical Properties of SiO2 Thin Films
WANG He1,2, HE Hong-Bo1, ZHANG Wei-Li1
图6 YAG111上SiO 2 薄膜的a划入深度-位置曲线和b划痕形貌
Fig. 6 Depth-displacement a curves and scratch track profiles b of SiO 2 film on YAG111