退火温度对TiO<sub>2</sub>基电阻开关器件性能的影响

退火温度对TiO₂基电阻开关器件性能的影响

李红霞, 季振国, 席俊华

Effects of Annealing Temperatures on Resistive Switching Characteristics of TiO₂ Based ReRAM

LI Hong-Xia, JI Zhen-Guo, XI Jun-Hua

图4 不同温度退火器件的高、低阻态电阻值及其高低阻值比
Fig. 4 Resistances in high and low resistance states and the ratio between HRS and LRS resistances of AuTiO 2 n + -Si devices as functions of different annealing temperatures