退火温度对TiO<sub>2</sub>基电阻开关器件性能的影响

退火温度对TiO₂基电阻开关器件性能的影响

李红霞, 季振国, 席俊华

Effects of Annealing Temperatures on Resistive Switching Characteristics of TiO₂ Based ReRAM

LI Hong-Xia, JI Zhen-Guo, XI Jun-Hua

图3 不同温度退火AuTiO 2 n + -Si器件的 I - V 特性曲线
Fig. 3 I - V characteristics of Au TiO 2 n + -Si devices as functions of annealing temperatures