Domain Morphology and Piezoelectric Properties of Si-doped PMS-PZT Piezoelectric Ceramics Affected by Grain Boundary Action

Abstract

Abstract: The microstructure, phase properties and domain morphology of Si-doped PMS-PZT ceramics were
investigated by using X-ray diffraction (XRD), transmission electron microscope (TEM) and energy dispersive spectrometry (EDS). XRD results
indicate that all specimens show perovskite structure and tetragonal distortion (c/a) increases as the dopant content increases. TEM results
show that domain morphology evolves from the normal herringbone domain to micron-sized lenticular shape domain structure, and finally changes to
“wavy” pattern as SiO₂ content changes from 0--1wt%. The nano-scale secondary phases of SiO₂ and PbSiO₃ were observed on the
grain boundary, and the twinned ZrO₂ was found surrounded by PMS-PZT perovskite phase. The mechanism of the appearance of twinned ZrO₂
and its content increase with the increase of Si concentration were discussed.

Key words: PMS-PZT, TEM, piezoelectric, domain structure

CLC Number:

TQ174
TM282

ZHU Zhi-Gang,LI Bao-Shan,LI Guo-Rong,ZHENG Liao-Ying,YIN Qing-Rui. Domain Morphology and Piezoelectric Properties of Si-doped PMS-PZT Piezoelectric Ceramics Affected by Grain Boundary Action[J]. Journal of Inorganic Materials.

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Domain Morphology and Piezoelectric Properties of Si-doped PMS-PZT Piezoelectric Ceramics Affected by Grain Boundary Action

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