Journal of Inorganic Materials ›› 2023, Vol. 38 ›› Issue (3): 280-287.DOI: 10.15541/jim20220642
• RESEARCH ARTICLE • Previous Articles Next Articles
QI Xuejun1(), ZHANG Jian1, CHEN Lei1, WANG Shaohan1, LI Xiang1, DU Yong1, CHEN Junfeng1,2(
)
Received:
2022-11-01
Revised:
2022-12-05
Published:
2023-01-11
Online:
2023-01-11
Contact:
CHEN Junfeng, professor. E-mail: jfchen@mail.sic.ac.cnAbout author:
QI Xuejun (1969-), female, senior engineer. E-mail: qixuejun@mail.sic.ac.cn
Supported by:
CLC Number:
QI Xuejun, ZHANG Jian, CHEN Lei, WANG Shaohan, LI Xiang, DU Yong, CHEN Junfeng. Macroscopic Defects of Large Bi12GeO20 Crystals Grown Using Vertical Bridgman Method[J]. Journal of Inorganic Materials, 2023, 38(3): 280-287.
Fig. 2 Macroscopic defects in as-grown Bi12GeO20 crystal ingots (a) As-grown Bi12GeO20 crystal ingots; (b, c) Dendritic inclusions; (d) Tubular scattering defects under the illumination of 532 nm laser light; (e) Tubular inclusions in polished crystals
Spectrum | Pt/% | Bi/% | Ge/% | O/% | Bi/Ge |
---|---|---|---|---|---|
1 | 6.85 | 39.57 | 3.15 | 50.43 | 12.56 |
2 | 100.0 | 0 | 0 | 0 | - |
3 | 88.20 | 2.08 | 0 | 9.72 | - |
Matrix | 0 | 36.27 | 3.11 | 60.62 | 11.66 |
Table 1 SEM-EDS composition analysis results of dendritic inclusions in Bi12GeO20 crystal (in atomic)
Spectrum | Pt/% | Bi/% | Ge/% | O/% | Bi/Ge |
---|---|---|---|---|---|
1 | 6.85 | 39.57 | 3.15 | 50.43 | 12.56 |
2 | 100.0 | 0 | 0 | 0 | - |
3 | 88.20 | 2.08 | 0 | 9.72 | - |
Matrix | 0 | 36.27 | 3.11 | 60.62 | 11.66 |
Fig. 5 Elemental mappings of the dendritic inclusions in Bi12GeO20 crystal at the microstructural level by scanning electron microscope (SEM) with energy dispersive X-ray spectrometry (EDS) (a, c) Mappings of Bi, Pt, O, Ge; (b, d) Respective mappings of Bi, Pt, O, Ge
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