Measurement and Analysis of Cu2S Thermal Diffusivity during Phase Transition

doi:10.15541/jim20190029

Abstract

Abstract:

Thermal diffusivity can be measured by the laser flash method. Previous study showed that Cu₂S has extremely low thermal diffusivity during the first-order phase transition. However, when laser is applied on the measured sample, both the absorption/emission of light and the increase of temperature on the measured sample will occur. Their effects on the measurement accuracy of the thermal diffusivity during the phase transition have not been investigated yet. In this study, it is found that the absorption/emission of light has neglectable influence on the thermal diffusivity measurement of Cu₂S. However, the increase of temperature can significantly influence the measurement results and shift the temperature when the thermal diffusivity of Cu₂S starts to decrease below the starting temperature of the phase transition determined by DSC. This can be solved by building a Cu₂S/graphite double-layer structure via using the graphite to absorb part of the laser’s energy. Furthermore, a thermal transport model is developed to extract the real thermal diffusivity from the measured thermal diffusivity of the Cu₂S/graphite double-layer structure. This work is meaningful for accurate characterization and understanding of the thermal diffusivity of phase transition materials, photosensitive materials, and heat sensitive materials.

Key words: thermal diffusivity, Cu₂S, phase transition

CLC Number:

TB34

CHEN Hong-Yi, SHI Xun, CHEN Li-Dong, QIU Peng-Fei. Measurement and Analysis of Cu₂S Thermal Diffusivity during Phase Transition[J]. Journal of Inorganic Materials, 2019, 34(10): 1041-1046.

Figures/Tables 5

Fig. 1 Temperature dependences of thermal diffusivity and heat capacity for (a) Cu2S and (b) Ag2S measured by LFA and DSC

Fig. 2 (a) Schematic map of thermal diffusivity test for Cu/Cu2S double-layer structure, (b) measured temperature dependence of thermal diffusivity for Cu/Cu2S double-layer structure

Fig. 3 (a) Schematic map of the reformed LFA457 instrument for the in-situ temperature characterization during measurement, (b) time dependence of temperature on the upper surface of the measured sample during the measurement with inset showing the infrared signal detected by the HgCdTe detectors

Fig. 4 (a) Theoretical maximum temperature increment on the upper surface of the measured sample during measurement and (b) measured temperature dependence of thermal diffusivity for a series of graphite/Cu2S double-layer structure samples The thicknesses of the graphite layers are 0, 0.13, 0.30, 0.64, and 1.34 mm

Fig. 5 (a) Model for thermal diffusivity analysis in a graphite/Cu2S double-layer structure, (b) intrinsic thermal diffusivity of Cu2S analyzed from the measured thermal diffusivity of the graphite/Cu2S double-layer structure samples.

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Measurement and Analysis of Cu₂S Thermal Diffusivity during Phase Transition

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