Journal of Inorganic Materials ›› 2013, Vol. 28 ›› Issue (8): 891-895.DOI: 10.3724/SP.J.1077.2013.12599

• Research Paper • Previous Articles     Next Articles

Defect Optical and Scintillation Properties of Lu2Si2O7:Ce Single Crystal Grown by Floating Zone Method

FENG He1, REN Guo-Hao2, DING Dong-Zhou2, LI Huan-Ying2, XU Jun2, YANG Qiu-Hong1, XU Jia-Yue3   

  1. 1. School of Materials Science and Engineering, Shanghai University, Shanghai 200072,China; 
    2. Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 201800, China; 
    3. School of Material Science and Engineering, Shanghai Institute of Technology, Shanghai 201418, China
  • Received:2012-10-08 Revised:2012-11-25 Published:2013-08-20 Online:2013-07-15
  • Supported by:

    National Natural Science Foundation of China (51171239); 973 Program(2011CB612310); Shanghai Science Key Fund (11JC1412400)

Abstract: Floating zone (Fz) method was employed to grow the Lu2Si2O7 (LPS):0.5%Ce single crystal. The crack, defect, optical and scintillation properties of LPS:Ce were studied. The electron probe microanalysis (EPMA), transmittance spectrum, X-ray excited luminescence (XEL) spectra, photoluminescence spectra and decay curves (from 77 K to 500 K) were recorded. The cleavage and thermal stress cracks are detected in the as-grown crystal. Two kinds of inclusions are found through the EPMA: one is [Si3O9]6- and  anion radicals and the other is the excess SiO2. Part of Ce3+ in the LPS:Ce sample was oxidized into Ce4+ in the air growth atmosphere. Fz grown LPS:0.5%Ce sample presents high luminescence efficiency, which is 32000 ph/MeV. As the temperature increases, the photoluminescence curves move towards the longer wavelength direction and broaden, leading to the increasing self-absorption. The rollover point of the decay time locates at 450 K, indicating that the LPS:Ce scintillator is a kind of high performance scintillator which can be applied in the high temperature environment.

Key words: Lu2Si2O7:Ce, floating zone method, single crystal, defects, scintillation properties

CLC Number: