Journal of Inorganic Materials

• Research Paper • Previous Articles     Next Articles

Study of Deep Bulk Traps of Low-Temperature-Sintered SrTiO3 GBBL Capacitors

LI Zheng; WANG Ping-Chu; XU Bac--Min; YIN Zhi-Wen   

  1. Shanghai Institute of Ceramics; Chinese Academy of Sciences Shanghai 200050 China
  • Received:1997-07-10 Revised:1900-01-01 Published:1998-04-20 Online:1998-04-20

Abstract: A deep bulk trap level of SrTiO3 grain boundary barrier layer (GBBL) capacitor material was found to be at about 0.21eV below its
conduction band by means of admittance spectroscopy. With temperature increasing from --150 to 10℃, the εeff protrusion and then the conspicuous dispersity of dielectric constant
were observed and explained. In terms of a combination of paraelectric behaviour of SrTiO3 and a deep bulk trap effect, an equivalent circuit model involving the
deep bulk level was given. Based on the model, a reasonable cosistency of calculated dielctric constants with experimental data was revealed.

Key words: SrTiO3, GBBL capacitor, dielectric constant, deep bulk trap

CLC Number: