无机材料学报 ›› 2011, Vol. 26 ›› Issue (6): 607-612.DOI: 10.3724/SP.J.1077.2011.00607

• 研究论文 • 上一篇    下一篇

气溶胶辅助化学气相沉积制备Al掺杂ZnO透明导电薄膜

秦秀娟1,2, 韩司慧智1, 赵 琳1, 左华通1, 宋士涛3   

  1. (1. 燕山大学 环境与化学工程学院, 秦皇岛 066004; 2. 亚稳材料制备技术与科学国家重点实验室, 秦皇岛 066004; 3. 河北科技师范学院 理学院, 秦皇岛 066004)
  • 收稿日期:2010-08-19 修回日期:2010-10-03 出版日期:2011-06-20 网络出版日期:2011-06-07
  • 作者简介:秦秀娟(1964-), 女, 博士, 教授. E-mail: qinxj@ysu.edu.cn
  • 基金资助:

    河北省自然科学基金(B2008000758)

Fabrication of Transparent Conductive Al-doped ZnO Thin Films by Aerosol-assisted Chemical Vapour Deposition

QIN Xiu-Juan1,2, HAN Si-Hui-Zhi1, ZHAO Lin1, ZUO Hua-Tong1, SONG Shi-Tao3   

  1. (1. College of Environmental and Chemical Engineering, Yanshan University, Qinhuangdao 066004, China; 2. State Key Laboratory of Metastable Materials Science and Technology, Qinhuangdao 066004, China; 3. College of Physics and Chemistry, Hebei Normal University of Science and Technology, Qinhuangdao 066004, China)
  • Received:2010-08-19 Revised:2010-10-03 Published:2011-06-20 Online:2011-06-07
  • Supported by:

    Natural Science Foundation of Hebei Province (B200800758)

摘要: 采用气溶胶辅助化学气相沉积(AACVD)法在玻璃衬底上制备了Al掺杂ZnO(AZO)薄膜. 研究了Al掺杂(2at%~8at%)对ZnO薄膜结构及光电性能的影响. 利用XRD、SEM、EDAX、紫外可见分光光度计等手段对样品进行测试. 结果表明, 制备的所有AZO薄膜均具有纤锌矿结构, 不具有沿c轴方向的择优取向, XRD图谱中未观察出Al的相关分相. 在可见光范围内, AZO薄膜的平均透过率大于72%, 光学禁带宽度随Al掺杂量的增加而变窄. 同时根据四探针技术所得的数据得知: Al的掺杂导致薄膜方块电阻的变化, 随着Al掺杂量的增加, 方块电阻有明显变小的现象, 掺杂6at%Al的AZO薄膜具有最低方块电阻(18Ω/□).

关键词: 气溶胶, 化学气相沉积法, Al:ZnO, 透明导电薄膜

Abstract: Al-doped ZnO thin films were prepared by aerosol-assisted chemical vapour deposition (AACVD) on glass substrates. The effect of Al content (2at%-8at%) on the structural, optical and electrical properties of Al-doped ZnO thin films was investigated in detail. The samples were tested by XRD, SEM, EDAX and UV-Vis spectrophotometer. The results indicate that the AZO films have a hexagonal (wurtzite) structure without preferential orientation along c-axis, and however no Al related phases are observed. The average transmittances of the AZO film is over 72% in the visible regions. The optical band gap for the AZO films becomes narrow with the increasing Al dopant. The four-point probe technique is used to characterize thin films electrically. The data shows that Al dopant decrease the sheet resistance. The ZnO films doped with 6at% Al exhibit a minimum of sheet resistance (18Ω/□).

Key words: aerosol, chemical vapour deposition, Al-doped ZnO, transparent conductive thin films

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