无机材料学报

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膨胀石墨CuCl2-EGICs的微观结构TEM研究

传秀云   

  1. 北京大学地质学系矿物教研室, 北京 100871
  • 收稿日期:1999-03-22 修回日期:1900-01-01 出版日期:2000-02-20 网络出版日期:2000-02-20

Micro-structures of the CuCl2-GICs on TEM

CHUAN Xiu-Yun   

  1. Department of Geology; Division of Mineral Materials; Peking University; Beijing 100871; China
  • Received:1999-03-22 Revised:1900-01-01 Published:2000-02-20 Online:2000-02-20

摘要:

采用透射电镜研究了以膨胀石墨为主体材料合成的CuCl-EGICs微观结构,包括垂直和平行石墨碳原子层的层间结构、层面结构.根据X射线衍射参数计算获得2、3、4阶CuCl-EGICs的层间距值,与理论计算值近似.选区电子衍射获得面内结构参数.发现EGICs衍射斑点是由石墨碳原子层单斑点和氯化物层多斑点簇组两套相迭而成.EGICs层面内碳原子层原子排布保持了石墨六角网格状的特点;氯化钢分子相对碳原子层分布有三种堆垛方式.倒易点分析认为有(2x2)(30°)、(71/2x71/2(0°)、(31/2x31/2(0°)三种超晶格结构.二阶、三阶CuCl-GIC中氯化铜点阵与碳原子点阵之间存在30°的偏转角,而在一阶CuCl-GIC中偏转角等于零度.根据高分辨电镜(HREM)、选区电子衍射(SAD)、能谱微区成分、光电子能潜(XPS-ESCA)和俄歇电子能谱(XAES)等结果,探讨和分析了CuCl-EGICs微观结构.

关键词: 石墨层间化合物(GIC), 微观结构, TEM, 选区衍射, 高分辨

Abstract: The layer and in-plane structure of CuCl2-GICs, synthesized with expanded graphite, was detected by TEM. The Ic values of the 2-,3-,4-stage
CuCl2-GICs calculated on the X-ray diffraction patterns was similar to the theoretical values. The parameter of the in-plane structure was calculated
on the selected area electron diffraction pattern. The diffraction spots of the GICs consist of single spots of carbon atom plane of graphite and triple
spots of chloride. The single spots imply that carbon atom of the in-plane of GICs is put in the order of the hexagonal net of graphite. Compared with
the size of carbon atom, the triple spots of chloride signify that there are three sizes of the molecule of cupric chloride. According to the lattice of CuCl2-GICs,
there are three kinds of super-structure:(2×2)R(30°, (71/2×71/2)R(0°), (31/2×31/2)R(0°). The angles of the lattice of cupric chloride and carbon atom are 30° in
the 2-stage and 3-stage CuCl2-GICs, 0° in 1-stage CuCl2-GICs. According to electron diffraction pattern, high resolution image, chemical compounds
analyses, XPS-ESCA and XAES, the frame of micro-structure of the CuCl2-GICs was made.

Key words: graphite intercalation compounds(GICs), micro-structure, TEM, electron diffraction, high resolution image

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