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硅基β-SiC薄膜外延生长的温度依赖关系研究

贾护军; 杨银堂; 朱作云; 李跃进   

  1. 西安电子科技大学微电子研究所, 西安 710071
  • 收稿日期:1999-03-26 修回日期:1999-06-21 出版日期:2000-02-20 网络出版日期:2000-02-20

Temperature Dependence of β-SiC Thin Films Epitaxial Grown on Si Substrates

JIA Hu-Jun; YANG Yin-Tang; ZHU Zuo-Yun; LI Yue-Jin   

  1. Microelectronics Institute; Xidian University; Xi an 710071; China
  • Received:1999-03-26 Revised:1999-06-21 Published:2000-02-20 Online:2000-02-20

摘要: 采用常压化学气相淀积(APCVD)工艺在1000~1400℃温度范围内的(100)Si衬底上进行了β-SiC薄膜的异质外延生长.实验结果表明,随着淀积温度的升高,外延层由多晶硅向β-SiC单晶转变,结晶情况变好;但同时单晶生长速率却反而有所下降.

关键词: 外延生长, β-SiC薄膜, 淀积温度, 结晶度

Abstract: β-SiC thin films were heteroepitaxially grown on (100)Si substrates at a temperaturerange from 1000 to 1400℃ by atmospheric pressure chemical vapor deposition (APCVD) process.Experimental results show that the epitaxial layers change from polycrystalline silicon into singlecrystal β-SiC state with the deposition temperature s increasing, but the growth rates of singlecrystal films decrease inversely.

Key words: epitaxial growth β-SiC films, deposition temperature, crystallinity

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